Spatially resolved characterization of superconducting films and cryoelectronic devices by means of low temperature scanning laser microscope
| Autor: | A. G. Sivakov, O. G. Turutanov, I.M. Dmitrenko, Alexander P. Zhuravel |
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| Rok vydání: | 1996 |
| Předmět: |
Superconductivity
Josephson effect Resistive touchscreen Materials science Microscope business.industry Analytical chemistry General Physics and Astronomy Surfaces and Interfaces General Chemistry Atmospheric temperature range Condensed Matter Physics Laser Surfaces Coatings and Films law.invention Condensed Matter::Materials Science law Condensed Matter::Superconductivity Optoelectronics Crystallite Thin film business |
| Zdroj: | Applied Surface Science. 106:390-395 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/s0169-4332(96)00445-x |
| Popis: | The work describes the low temperature scanning laser microscopy technique used for spatially resolved characterization of superconducting films and film-based cryoelectronic circuits in the temperature range from 2 to 300 K. The determination of superconducting parameters for separate elements of a high T c Josephson junctions array and imaging of the resistive transition in a high T c superconducting polycrystalline film are demonstrated. The spatial evolution of the resistive state of a Sn thin film strip associated with the phase slip lines formation is visualized. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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