| Autor: |
Germain Rey, Thorsten Trupke, Ziv Hameiri, Raghavi Bhoopathy, Oliver Kunz, Yoann Buratti |
| Rok vydání: |
2021 |
| Předmět: |
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| Zdroj: |
Physics, Simulation, and Photonic Engineering of Photovoltaic Devices X. |
| Popis: |
Luminescence imaging has been adopted rapidly as efficient research and development tool for photovoltaic devices. We review applications of line scan photoluminescence imaging for high throughput non-contact end of line inspection of silicon solar cells, with particular emphasis on the correlation between metrics derived from photoluminescence images and the electrical performance parameters of solar cells. In the second part we review photoluminescence imaging methods for the inspection of crystalline silicon photovoltaic modules that rely on the sun as the sole excitation source and that can be performed outdoors on installed modules during normal system operation and in full daylight. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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