Dynamic interferometric imaging of the thickness distribution of evaporating thin liquid films
| Autor: | Julian Schäfer, Tobias Hartwig, Dominik Daume, Jacqueline Stamm, Maximilian Oschmann, Edgar Dörsam, Hans Martin Sauer |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Materials science
business.industry 02 engineering and technology Surfaces and Interfaces General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Frame rate 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Colloid and Surface Chemistry Optics Solvent evaporation Interferometric imaging Homogeneity (physics) Thin-film interference Thin film 0210 nano-technology business Image resolution |
| Zdroj: | Journal of Coatings Technology and Research. 16:1663-1671 |
| ISSN: | 1935-3804 1547-0091 |
| Popis: | In functional printing, film homogeneity is a key criterion, but there are several phenomena leading to inhomogeneities. We shall focus on the solvent evaporation process of gravure-printed thin films. The best aspects of different published approaches are combined to create a new algorithm for optically determining the film thickness development. In this way, small structures as well as the overall thickness of large-area thin films can be tracked while drying. It becomes clear that the biggest challenge is balancing the camera resolution and frame rate to receive plausible and accurate results. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink