Size&Strain VI

Autor: René Guinebretière, Olivier P. Thomas
Rok vydání: 2013
Předmět:
Zdroj: Thin Solid Films. 530:1
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2012.12.002
Popis: ontributions that were presented at the sixth Size and Strain conference held in Presqu'ile de Giens, France, from 17 to 20 October, 2011. The Size-Strain conference is devoted to the analysis of the microstructure of materials by diffraction. Diffraction (X-rays, neutrons) was recognized very early as a very sensitive tool for analyzing deviations from perfect periodicity in crystals. Indeed, point, line, or planar defects yield distinct signatures in diffraction patterns. In the same way, displacement fields and surfaces induce characteristic features in diffracted intensities. In the field of powder diffraction, Line Profile Analysis (LPA) is an important method to extract microstructural information (size, strain, stacking fault, or dislocation density, etc.) from diffraction lines. More recently, the advent of nanobeams on 3rd generation synchrotrons has opened theway to very local investigations, which go beyond the statistical information given by LPA and bring new insights into the models used for LPA. Coherent X-ray diffraction is also a very promising method, which in the near future should allow strain mapping at the nanoscale. Size-Strain VI is the sixth conference in a series. The previous conferences were held in the following places: 1995 Liptovsky Mikulas (Slovakia), 1998 Freiberg (Germany), 2001 Trento (Italy), 2004 Prague (Czech Republic), and 2007 Garmisch-Partenkirchen (Germany). In close relation to the previous Size-Strain conferences, SS-VI focuses on methodologies for the study of lattice defects, residual stress, and texture in thin films, surfaces, and nanostructures, line-broadening analysis, line-profile fitting, and modeling based on fundamental parameters for applications in materials science problems. Newdevelopments for localmeasurements such asmicrobeam diffraction or coherent diffraction are also of special interest. During the summer of 2011,we received the sad news that Professor Robert Snyder passed away. Bob was a member of our scientific committee and a pioneer of this conference. A special tribute was dedicated to him and his career during the conference. Size-Strain VI gathered 102 attendees from 15 different countries. Sunny weather, a lively atmosphere, and a very good scientific program made this conference a very pleasant experience. Finally, the organizing committee has been instrumental in making things work. We really would like to warmly thank Cathy Paitel, Vanessa Coulet, Stephanie Escoubas, Sophie Girardin, and Stephane Labat for their dedication.Without them, the conference would certainly not have been such a great success.
Databáze: OpenAIRE
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