Experimental study of the relationships between the near-normal reflectance, the optical constants, and the roughness of thin silver films
| Autor: | Nicole Mayani, G. Rasigni, F. Varnier |
|---|---|
| Rok vydání: | 1990 |
| Předmět: |
Elastic scattering
Materials science business.industry Surface plasmon Surface finish Atomic and Molecular Physics and Optics Photon counting Electronic Optical and Magnetic Materials Autocovariance symbols.namesake Optics Fourier transform symbols Computer Vision and Pattern Recognition Thin film business Refractive index |
| Zdroj: | Journal of the Optical Society of America A. 7:191 |
| ISSN: | 1520-8532 1084-7529 |
| DOI: | 10.1364/josaa.7.000191 |
| Popis: | Independent measurements of the rms roughness and the reflectance have been made on silver films deposited on CaF2, LiF, and MgF2 thin films of various degrees of roughness. These measurements show a linear relationship between the dip in the magnitude of the near-normal reflectance minimum at the plasma energy and the rms roughness δ of the various samples. The autocovariance length of the rough surface turns out to have little influence on the relationship between the magnitude of the reflectance and δ. The relationships between the optical constants of silver films and δ are also investigated. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|