Analysis of insulation resistance degradation in Ni–BaTiO3multilayer ceramic capacitors under highly accelerated life test
| Autor: | Nobuyoshi Fujikawa, Takao Sada |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science Fabrication genetic structures Physics and Astronomy (miscellaneous) General Engineering Electrical breakdown General Physics and Astronomy 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Dielectric layer 0103 physical sciences Degradation (geology) Composite material 0210 nano-technology Ceramic capacitor Insulation resistance Early failure Highly accelerated life test |
| Zdroj: | Japanese Journal of Applied Physics. 56:10PB04 |
| ISSN: | 1347-4065 0021-4922 |
| DOI: | 10.7567/jjap.56.10pb04 |
| Popis: | The degradation mechanism of electrical breakdown in Ni–BaTiO3 multilayer ceramic capacitors (MLCCs) was studied by visualizing degraded areas in early failure and wear-out failure modes. The visualization was achieved by the fabrication of electrically degraded MLCCs just before electrical breakdown and by detection of the degraded area by infrared-optical-beam-induced resistance change (IR-OBIRCH) analysis. In the case of our prototype MLCCs, a thinner dielectric layer caused early failure and microstructural abnormalities in the dielectric layer caused wear-out failure. Such a visualization method directly demonstrates the causes of electrical breakdown in MLCCs. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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