Enhancing memristor fundamentals through instrumental characterization and understanding reliability issues
| Autor: | Fei Qin, Yuxuan Zhang, Han Wook Song, Sunghwan Lee |
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| Rok vydání: | 2023 |
| Předmět: | |
| Zdroj: | Materials Advances. 4:1850-1875 |
| ISSN: | 2633-5409 |
| DOI: | 10.1039/d3ma00069a |
| Popis: | A memristor is a promising synaptic device for neuromorphic computing. This review article encompasses various instrumental characterization methods which enhance a fundamental understanding of the switching and reliability mechanisms of memristors. |
| Databáze: | OpenAIRE |
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