Characterization of nanoparticles using Atomic Force Microscopy
| Autor: | Th. Glatzel, Akshata Rao, D Brändlin, Enrico Gnecco, M Schoenenberger, Ernst Meyer, L. Scandella |
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| Rok vydání: | 2007 |
| Předmět: |
Kelvin probe force microscope
History Materials science Silicon technology industry and agriculture chemistry.chemical_element Nanoparticle Nanotechnology Conductive atomic force microscopy Computer Science Applications Education Characterization (materials science) Titanium oxide chemistry Microscopy Mica |
| Zdroj: | Journal of Physics: Conference Series. 61:971-976 |
| ISSN: | 1742-6596 1742-6588 |
| DOI: | 10.1088/1742-6596/61/1/192 |
| Popis: | Nanoparticles are becoming increasingly important in many areas, including catalysis, biomedical applications, and information storage. Their unique size-dependent properties make these materials superior. Using the Atomic Force Microscope (AFM), individual particles and groups of particles can be resolved and unlike other microscopy techniques, the AFM offers visualization and analysis in three dimensions. We prepared titanium oxide, zirconium oxide and alumina nanoparticles and/or agglomerates on different surfaces and characterized them by AFM in the dynamic mode. The goal was to determine the shape, size and/or size distribution of nanoparticles. Different dilutions of nanoparticles were applied on various substrates e.g. clean silicon, mica and chemically treated silicon and imaged at ambient conditions. Nanoparticles deposited on mica appeared to be coagulated as compared to those on silicon. Whereas, on a chemically treated surface the density of the nanoparticles was very low because of the increased hydrophobicity of the surface. |
| Databáze: | OpenAIRE |
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