Nonlinear high resolution image processing of conventional transmission electron micrographs
| Autor: | Natsu Uyeda, Yoshifumi Fujiyoshi, B.M. Siegel, Earl J. Kirkland |
|---|---|
| Rok vydání: | 1982 |
| Předmět: |
Materials science
Micrograph business.industry Resolution (electron density) Phase (waves) Image processing Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Nonlinear system Amplitude Optics law Transmission electron micrograph Electron microscope business Instrumentation |
| Zdroj: | Ultramicroscopy. 9:65-74 |
| ISSN: | 0304-3991 |
| DOI: | 10.1016/0304-3991(82)90229-7 |
| Popis: | A new method of nonlinear image processing is applied to high resolution experimental micrographs of chlorinated copper phthalocyanine taken on the Kyoto 500 kV electron microscope. With this new method of image processing the phase and amplitude of the specimen transmission function are reconstructed from a defocus series of conventional transmission electron micrographs. In a companion paper (the first part of this two-part report) this method was presented and tested on theoretically simulated images and in this paper it is tested on actual experimental micrographs. In each case a moderately significant increase in resolution has been obtained with computer image processing. The point to point resolution obtained here with computer image processing of 500 kV electron micrographs is of the order of 1.2–1.4 A. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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