A beam line for highly charged ions

Autor:	C A. Morgan, E W. Bell, A. I. Pikin, D. A. Church, John D. Gillaspy, L P. Ratliff
Rok vydání:	1996
Předmět:	Range (particle radiation) Materials science Ion beam chemistry.chemical_element Particle accelerator Charged particle Ion law.invention Xenon Beamline chemistry law Physics::Accelerator Physics Atomic physics Instrumentation Electron beam ion trap
Zdroj:	Review of Scientific Instruments. 67:2528-2533
ISSN:	1089-7623 0034-6748
Popis:	The design and operation of a beam line for transporting and charge‐to‐mass selecting highly charged ions extracted from the National Institute of Standards and Technology electron beam ion trap (EBIT) are described. This beam line greatly extends the range of experiments possible at this facility. Using the transport system, pure beams of low‐energy, highly charged ions up to Xe44+ have been produced with substantially higher fluxes than previously reported from an EBIT source. Design choices and computer modeling for the various components of the beam line are explained in detail.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::832bf2d8ecae90f80fa233a52b174545 https://doi.org/10.1063/1.1147192 Zobrazit plný text záznamu