A luminescence mapping technique for rapid evaluation of visible-light-emitting materials used in semiconductor light-emitting diodes

Autor:	D.V. Morgan, H. Thomas, Y.H. Aliyu
Rok vydání:	1997
Předmět:	Fabrication Photoluminescence Materials science business.industry Applied Mathematics Electroluminescence law.invention Semiconductor law Optoelectronics Wafer Luminescence business Instrumentation Engineering (miscellaneous) Diode Light-emitting diode
Zdroj:	Measurement Science and Technology. 8:437-440
ISSN:	1361-6501 0957-0233
DOI:	10.1088/0957-0233/8/4/011
Popis:	A technique for the rapid evaluation of the optical performance of wafers grown for fabricating visible-light-emitting diodes (LEDs) is presented. The technique is simple, non-destructive and can be used to qualify wafers prior to the relatively expensive device-processing stage. The technique resolves the problem resulting from the lack of correlation between photoluminescence measurements on as-grown materials and electroluminescence on the final structures. The lack of such correlation has been a pertinent problem for the material growth industry. The materials used for this investigation are those grown specifically for the fabrication of high-performance LEDs.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8311629b6a5784536a972f0857faa14e https://doi.org/10.1088/0957-0233/8/4/011 Zobrazit plný text záznamu