An Algorithmic Approach to Observed Single Event Effects in Van Allen Probes Solid State Recorders
| Autor: | Ethan Mellert, Richard H. Maurer, Geffrey Ottman |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
Nuclear and High Energy Physics
Spacecraft 010308 nuclear & particles physics business.industry Computer science Solid-state 01 natural sciences Upset Spacecraft design Nuclear Energy and Engineering Position (vector) 0103 physical sciences Synchronous dynamic random-access memory Van Allen Probes Electrical and Electronic Engineering business Algorithm Event (probability theory) |
| Zdroj: | IEEE Transactions on Nuclear Science. 66:2408-2416 |
| ISSN: | 1558-1578 0018-9499 |
| Popis: | A new algorithmic approach yields insights into the relationship between predicted and on-orbit synchronous dynamic random access memory (SDRAM) error rates on the Van Allen Probes. This article describes more than 5.5 years of data on Solid State Recorder Single Event Effects (SEEs) from December 4, 2012 to June 30, 2018. We compare observations with predictions from the early spacecraft design and give reasons for the large overpredictions. We analyze observed SEEs versus L-shell position and the memory device location on the Solid State Recorder electronic card. We examine the differences among the outlying SEE-susceptible devices on the two spacecraft. The inflight results demonstrate the conservatism of the predictions for the overall upset rate. |
| Databáze: | OpenAIRE |
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