Magnetic Compton Profile Measurement of Thin Films
| Autor: | Hiroshi Sakurai, Masayoshi Itou, Masahisa Ito, Yoshiharu Sakurai, Ryutaro Yamaki, Hiroyuki Nishino |
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| Rok vydání: | 2010 |
| Předmět: |
Materials science
Scattering business.industry Astrophysics::High Energy Astrophysical Phenomena Mechanical Engineering Vacuum tube Compton scattering Electronic structure Substrate (electronics) law.invention chemistry.chemical_compound Optics Silicon nitride chemistry Mechanics of Materials law General Materials Science Thin film business |
| Zdroj: | Key Engineering Materials. 459:11-14 |
| ISSN: | 1662-9795 |
| DOI: | 10.4028/www.scientific.net/kem.459.11 |
| Popis: | We have measured magnetic Compton profile of Co/Pd thin films sputtered on a substrate for studying the electronic structure. For the first time, a silicon nitride substrate of 100 nm thickness we used in the magnetic Compton scattering experiment. We have improved vacuum tubes of the Compton beam-line BL08W of SPring-8, and have reduced greatly the background scattering for the Compton profile. We have succeeded in measuring magnetic Compton profile of Co (0.8 nm)/Pd (1.6 nm) 400 nm multilayer. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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