Reflecting p-contact based on thin ITO films for AlGaInN flip-chip LEDs

Autor: I. P. Smirnova, A. S. Pavlyuchenko, E. M. Arakcheeva, L. K. Markov, M. M. Kulagina
Rok vydání: 2009
Předmět:
Zdroj: Semiconductors. 43:1521-1525
ISSN: 1090-6479
1063-7826
DOI: 10.1134/s1063782609110219
Popis: A reflecting contact to a p-GaN layer, used in fabrication of blue flip-chip light-emitting diodes, has been produced by deposition of thin indium tin oxide (ITO) films by electron-beam evaporation. The high reflectance of the contact, which exceeds that of a Ni/Ag contact, provides a 15–20% increase in the external quantum efficiency of light-emitting crystals. The forward voltage drops for crystals with an ITO(5 nm)/Ag(220 nm) contact are comparable with the corresponding values for crystals with a Ni(1.5 nm)/Ag(220 nm) contact. The specific resistance of the contact with an ITO layer is 3.7 × 10−3 Ω cm2. It is shown that, for ITO films produced by the given method, the optimal thicknesses providing the best electrical and optical characteristics of the crystals are in the range 2.5–5.0 nm.
Databáze: OpenAIRE