Compact test generation for full scan sequential circuits using multiple frame vectors

Autor:	Dong Ho Lee, Hyun Chul Noh
Rok vydání:	1999
Předmět:	Sequential logic business.industry Logic testing Scan chain Multiple frame Electrical and Electronic Engineering business Algorithm Computer hardware Mathematics Test (assessment) Test set compaction
Zdroj:	Electronics Letters. 35:182
ISSN:	0013-5194
DOI:	10.1049/el:19990145
Popis:	A new test set compaction method that uses multiple frame vectors to test fully scanned sequential circuits is proposed. The FAN algorithm is extended to generate compact multiple frame test vectors. The proposed method generates the smallest test sets among all recognised full scan test set compaction algorithms.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::81e55eb6e284c523c455498a6660b442 https://doi.org/10.1049/el:19990145 Zobrazit plný text záznamu