Improved device performance of AlGaInP-based vertical light-emitting diodes with low-n ATO antireflective coating layer
| Autor: | Jae Su Yu, Myung Sub Kim, Hee Kwan Lee |
|---|---|
| Rok vydání: | 2013 |
| Předmět: |
Materials science
business.industry engineering.material Electroluminescence Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention Optics Anti-reflective coating Coating Sputtering law engineering Optoelectronics Electrical and Electronic Engineering business Refractive index Layer (electronics) Diode Light-emitting diode |
| Zdroj: | Microelectronic Engineering. 104:29-32 |
| ISSN: | 0167-9317 |
| Popis: | We reported the effect of low-n Sb-doped tin oxide (ATO) antireflective (AR) coating layer on the device performance of AlGaInP-based red vertical light-emitting diodes (VLEDs). The ATO films with a quarter wavelength thickness of ~90nm were deposited on the p-GaP window layer by an oblique-angle sputtering method. The ATO films with inclined nanocolumnar structures indicated a low refractive index of ~1.8 at emitting wavelengths of AlGaInP-based VLEDs. For VLED with low-n ATO AR coating layer, the light output power was increased by 26% at 350mA with no deterioration of the electrical property compared to the conventional LED. Also, the enhanced light extraction led to the reduction in the electroluminescence peak wavelength shift at higher injection currents. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect