Application of thermal wave imaging and phase shifting method for defect detection in Stainless steel
| Autor: | Ranjit Shrestha, Wontae Kim, Jeong-Hak Park |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Materials science
business.industry Phase contrast microscopy 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Sample (graphics) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention 010309 optics Optics Contrast-to-noise ratio law 0103 physical sciences Thermography Defect size Thermal wave 0210 nano-technology business Excitation |
| Zdroj: | Infrared Physics & Technology. 76:676-683 |
| ISSN: | 1350-4495 |
| DOI: | 10.1016/j.infrared.2016.04.033 |
| Popis: | This paper presents an experimental arrangement for detection of artificial subsurface defects in a stainless steel sample by means of thermal wave imaging with lock-in thermography and consequently, the impact of excitation frequency on defect detectability. The experimental analysis was performed at several excitation frequencies to observe the sample beginning from 0.18 Hz all the way down to 0.01 Hz. The phase contrast between the defective and sound regions illustrates the qualitative and quantitative investigation of defects. The two, three, four and five-step phase shifting methods are investigated to obtain the information on defects. A contrast to noise ratio analysis was applied to each phase shifting method allowing the choice of the most appropriate one. Phase contrast with four-step phase shifting at an optimum frequency of 0.01 Hz provides excellent results. The inquiry with the effect of defect size and depth on phase contrast shows that phase contrast decreases with increase in defect depth and increases with the increase in defect size. |
| Databáze: | OpenAIRE |
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