Optical Waveguiding Properties of RF Diode Sputtered LiNbO3Thin Films
| Autor: | Navina Mehan, Abhai Mansingh, Monika Tomar, K. Sreenivas |
|---|---|
| Rok vydání: | 2005 |
| Předmět: |
Fused quartz
Materials science Birefringence business.industry Lithium niobate Substrate (electronics) Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention chemistry.chemical_compound Optics chemistry law Sputtering Optoelectronics Prism Thin film business Refractive index |
| Zdroj: | Ferroelectrics. 329:61-64 |
| ISSN: | 1563-5112 0015-0193 |
| DOI: | 10.1080/00150190500315434 |
| Popis: | LiNbO 3 thin films have been deposited on fused quartz substrates with ZnO buffer layer using rf sputtering technique at a low substrate temperature of 450°C. The wave guiding characteristics were studied using prism coupling technique. Two TE and two TM modes (of order m = 0 and m = 1) were excited and detected in the LiNbO 3 films by observing a streak of light emanating from the prism base. The propagation constants of the modes were determined and from these, the ordinary and extraordinary refractive indices were determined as n o = 2.222 and n e = 2.200 respectively, which are close to the bulk values of 2.296 and 2.208 respectively. The birefringence (n o −n e ) of 0.022 is high and the thickness of the film was estimated to be (0.51± 0.01) μm using this technique. |
| Databáze: | OpenAIRE |
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