Current–voltage and capacitance–voltage characteristics of metallic polymer/InSe(:Er) Schottky contacts

Autor: Y.K. Yoğurtçu, B. Abay, Hasan Efeoglu, Abdulmecit Türüt, Mustafa Sağlam, Yavuz Onganer
Rok vydání: 2000
Předmět:
Zdroj: Microelectronic Engineering. :689-693
ISSN: 0167-9317
DOI: 10.1016/s0167-9317(99)00532-8
Popis: An investigation of metallic polypyrrole polymer (MPP)/ n -InSe(:Er) (by an anodization process) Schottky barrier diodes (SBDs) fabricated on a cleaved n -type InSe(:Er) substrate, which is a layered semiconductor, has been made. The metallic polypyrrole film provides a good rectifying contact to the n- InSe(:Er) semiconductor. The current–voltage ( I – V ) and capacitance–voltage ( C – V ) characteristics of the diode have been determined at room temperature. The diode shows nonideal I – V behavior with an ideality factor greater than one. In addition, the I – V characteristics of the (MPP)/ n -InSe(:Er) device shows an improvement with an increased Φ b0 and a decreased ideality factor after the polymer melt processing step. The reverse bias C −2 – V characteristics of the diode shows a non-linear behavior.
Databáze: OpenAIRE