X-Ray Fluorescence Analysis: Useful For Forensic Examination

Autor: Mukesh Sharma, Shailendra Jha
Rok vydání: 2016
Předmět:
Zdroj: Journal of Forensic Sciences & Criminal Investigation. 1
ISSN: 2476-1311
DOI: 10.19080/jfsci.2016.01.555553
Popis: In the field of forensic science, it is very important to investigate of evidential samples obtained at various crime scenes. X-ray fluorescence (XRF) is used widely in forensic science. Its main strength is its non-destructive nature, thus preserving evidence. This paper, deals with the application of XRF to examine the evidences like purity gold and silver jewelry (Indian Ornaments), remnants of glass pieces and paint chips recovered from crime scenes. The experimental measurements on these samples have been made using X-ray fluorescence spectrometer (LAB Center XRF-1800) procured from Shimazdu Scientific Inst., USA. The results are explained in terms of quantitative/ qualitative analysis of trace elements how useful for forensic point of view.
Databáze: OpenAIRE