A Survey on Advanced Methods for Segmentation of Structures in H and E Stained Images

Autor:	S.B. Pawar, V. Gaikwad
Rok vydání:	2018
Předmět:	Computer science business.industry H&E stain Segmentation Pattern recognition Artificial intelligence business
Zdroj:	International Journal of Computer Sciences and Engineering. 6:278-282
ISSN:	2347-2693
DOI:	10.26438/ijcse/v6i2.278282
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::816c5a4247641d8799cb047debf43717 https://doi.org/10.26438/ijcse/v6i2.278282 Zobrazit plný text záznamu