Autor: |
Abraham Picos-Vega, Mufei Xiao |
Rok vydání: |
2001 |
Předmět: |
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Zdroj: |
Physics Letters A. 285:395-400 |
ISSN: |
0375-9601 |
DOI: |
10.1016/s0375-9601(01)00359-0 |
Popis: |
We demonstrate that the edge recoiling of diffusion may cause anomaly in transient photo-currents measured by the time-of-flight technique for homogeneous amorphous materials. The universality of the anomalous transports is successfully revealed in this new macroscopic explanation. The anomaly in the transient currents is directly related to the degree of the diffusion and the drift. In the previously established continuous-time-random-walk theory, similar anomalous transports were attributed to some unusual microscopic process of retarded trapping–releasing and hopping. We show that the same effects may present in homogeneous materials with normal diffusion process. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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