Polychromatic simultaneous WDXRF for chemical state analysis using laboratory X-ray source
| Autor: | Kenji Sato, Masatomo Kaino, Nishimura Akihiro, Susumu Adachi |
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| Rok vydání: | 2017 |
| Předmět: |
Range (particle radiation)
Spectrometer Silicon Chemistry 010401 analytical chemistry Resolution (electron density) Detector Analytical chemistry chemistry.chemical_element 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Crystal Chemical state Goniometer 0210 nano-technology Spectroscopy |
| Zdroj: | X-Ray Spectrometry. 46:330-335 |
| ISSN: | 0049-8246 |
| DOI: | 10.1002/xrs.2797 |
| Popis: | The authors have started the development of a new scanning-free, wavelength-dispersive X-ray fluorescence spectrometer, which uses a silicon strip detector instead of a goniometer, a slit, flat analyzing crystal, and laboratory X-ray source. The X-rays dispersed by the slit and flat analyzing crystal are detected simultaneously by different silicon strip detector channels, and a high energy resolution is achieved by limiting the measurement range. In the spectrometer designed for Cr, Mn, and Fe in the range from 5.38 to 6.64 keV, an energy resolution of 3.9 eV for Fe Kα1 was obtained, and it was observed that KMnO4 (VII) is different from MnO (II) in the peak energy of Mn Kβ1,3. Furthermore, a Kβ' satellite peak on the low-energy side of Mn Kβ1,3 was clearly observed, and the difference in behavior of Kβ' was investigated. Another similar investigation of Cr2O3 (III) and K2CrO4 (VI) was performed. These results indicate that the new wavelength-dispersive X-ray fluorescence spectrometer has a high energy resolution and is applicable to the chemical state analysis of 3d transition elements, which is obtained by analyzing the details of the Kβ peak at the scale of a few eV. Copyright © 2017 John Wiley & Sons, Ltd. |
| Databáze: | OpenAIRE |
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