Evaluation on Board-Level Noise Filter Networks to Suppress Transient-Induced Latchup in CMOS ICs Under System-Level ESD Test
| Autor: | Sheng-Fu Hsu, Ming-Dou Ker |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Engineering
Electrostatic discharge business.industry Noise reduction Electrical engineering Electromagnetic compatibility Hardware_PERFORMANCEANDRELIABILITY Ring oscillator Integrated circuit design Integrated circuit Condensed Matter Physics Atomic and Molecular Physics and Optics law.invention Rectifier CMOS law Hardware_INTEGRATEDCIRCUITS Electronic engineering Electrical and Electronic Engineering business Hardware_LOGICDESIGN |
| Zdroj: | IEEE Transactions on Electromagnetic Compatibility. 48:161-171 |
| ISSN: | 0018-9375 |
| DOI: | 10.1109/temc.2006.870681 |
| Popis: | Different types of board-level noise filter networks are evaluated to find their effectiveness for improving the immunity of CMOS ICs against the transient-induced latchup (TLU) under the system-level electrostatic discharge (ESD) test. By choosing proper components in each noise filter network, the TLU immunity of CMOS ICs can be greatly improved. All the experimental evaluations have been verified with the silicon-controlled rectifier (SCR) test structures and the ring oscillator circuit fabricated in a 0.25-mum CMOS technology. Some board-level solutions can be further integrated into the chip design to effectively improve the TLU immunity of CMOS IC products |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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