Morphology and Thermal Stability of the Active Layer in Poly(p-phenylenevinylene)/Methanofullerene Plastic Photovoltaic Devices
Autor: | J Joachim Loos, Xiaoniu Yang, Maj Thijs Michels, Jkj Jeroen van Duren, Raj René Janssen |
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Rok vydání: | 2004 |
Předmět: |
chemistry.chemical_classification
Materials science Polymers and Plastics Stereochemistry Organic Chemistry Composite number Polymer Inorganic Chemistry chemistry Chemical engineering Nanocrystal Electron diffraction Transmission electron microscopy Materials Chemistry Thermal stability Thin film Selected area diffraction |
Zdroj: | Macromolecules. 37:2151-2158 |
ISSN: | 1520-5835 0024-9297 |
DOI: | 10.1021/ma035620+ |
Popis: | The morphology of composite thin films consisting of a conjugated polymer (poly[2-methoxy-5-(3‘,7‘-dimethyloctyloxy)-1,4-phenylenevinylene], MDMO-PPV) and methanofullerene ([6,6]-phenyl C61 butyric acid methyl ester, PCBM), which are used as the active layer in polymer photovoltaic devices, has been extensively studied using transmission electron microscopy (TEM) and selected-area electron diffraction (SAED). Composite MDMO-PPV:PCBM films have been prepared with PCBM concentrations varying from 20 to 90 wt %. PCBM-rich clusters are clearly observed in TEM bright-field mode when the PCBM concentration is increased to ca. 75 wt % in the composite film. The SAED analysis shows that these clusters consist of many PCBM nanocrystals with random crystallographic orientations. Furthermore, we show that these nanocrystals are also present in the homogeneous matrix at PCBM concentrations below 75 wt %. Annealing of the blend films has been performed at temperatures between 60 and 130 °C for different times. In all ... |
Databáze: | OpenAIRE |
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