Photoacoustic spectroscopy analysis of thin semiconductor samples
| Autor: | Leszek Bychto, Mirosław Maliński |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Materials science
genetic structures Physics::Optics 02 engineering and technology Substrate (electronics) 01 natural sciences Spectral line 0103 physical sciences Transmission method General Materials Science Electrical and Electronic Engineering Photoacoustic spectroscopy 010302 applied physics Radiation Thin layers business.industry 021001 nanoscience & nanotechnology eye diseases Frequency spectrum Condensed Matter::Soft Condensed Matter Semiconductor Amplitude Optoelectronics sense organs 0210 nano-technology business |
| Zdroj: | Opto-Electronics Review. 26:217-222 |
| ISSN: | 1230-3402 |
| Popis: | This paper is an analysis of determination possibility of the optical absorption coefficient spectra of thin semiconductor layers from their normalized photoacoustic amplitude spectra. Influence of multiple reflections of light in thin layers on their photoacoustic and optical absorption coefficient spectra is presented and discussed in detail. Practical formulae for the optical absorption coefficient spectrum as a function of the normalized photoacoustic amplitude spectrum are derived and presented. Next, they were applied for computations of the optical absorption coefficient spectra of thin In2S3 thin layers deposited on a glass substrate. This method was experimentally verified with the optical transmission method. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|