| Popis: |
We report on Mn K‐edge X‐ray absorption study, in plane and out of plane, of La0.7Sr0.3MnO3 films, epitaxially grown on a tensile substrate SrTiO3 by laser ablation. From Extended X‐ray Absorption Fine Structure in the film plane we observe a small increase of Mn‐Mn distances with respect to relaxed film. In addition, a small distortion of the MnO6 octahedron is evidenced from Extended and Near Edge Absorption measurements. The respective amplitudes found for these two effects are on the same order, so that no modification of the Mn‐O‐Mn angle is evidenced. |
