| Autor: |
S. Egot, M. Klingler, J. Rioult, J.-P. Ghys |
| Rok vydání: |
2002 |
| Předmět: |
|
| Zdroj: |
2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161). |
| DOI: |
10.1109/isemc.2001.950561 |
| Popis: |
Three-dimensional TEM cells offer new issues in EMC immunity and emission testing, where the question of orienting the object under test is no longer raised. This paper starts by presenting the general concept of 3-D TEM cells and hybrid chambers followed by one of the first applications in measuring the total radiated power of devices under test. After a short background on emission measurements in TEM and GTEM cells, the second part of this paper considers a practical industrial case where the total radiated power of an electronic equipment is measured in a 3-D TEM prototype cell, and the results compared to those of TEM and GTEM cells. Finally, the repeatability and reproducibility between TEM, GTEM and 3-D TEM cells is studied and discussed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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