An X-ray Photoelectron Spectroscopie Study of B-N-Ti system

Autor:	Sudipta Seal, Jerzy Morgiel, Tery L. Barr, Ewa Benko, Natalie Sobczak
Rok vydání:	1997
Předmět:	Crystallography Materials science chemistry X-ray photoelectron spectroscopy Chemical engineering Sputtering Transmission electron microscopy Composite number X-ray crystallography chemistry.chemical_element Nitride Tin Microstructure
Zdroj:	MRS Proceedings. 472
ISSN:	1946-4274 0272-9172
DOI:	10.1557/proc-472-269
Popis:	Composite nitrides (such as BN, TiN) are widely used in various industrial applications because of their extreme wear and corrosion resistance, thermal and electrical properties. In order to obtain composite materials with mese optimal properties, it is important to elucidate whether any chemical reactions occur at nitride/metal interfaces, e.g., those involving BN-Ti/TiN. Materials of interest include the deposition by PVD of Ti and TiN on BN substrates. Some of these systems were then subjected to varying degrees of physical and thermal alteration. Detailed X-ray photoelectron spectroscopy (XPS) has merefore been rendered of these interfaces using cross-sectional display and sputter etching. Resulting structural and morphological features have been investigated with transmission electron microscopy (TEM) and X-ray diffraction (XRD). Diffusion of the nitridation, oxynitride formation and interfacial growth are of general interest.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7fefe08597d669735433c468c588d6c9 https://doi.org/10.1557/proc-472-269 Zobrazit plný text záznamu Full text from SpringerLink