Characterization of II-VI semiconductor materials using surface analytical techniques

Autor:	Martyn H. Kibel
Rok vydání:	1990
Předmět:	Auger electron spectroscopy Materials science X-ray photoelectron spectroscopy Semiconductor materials Nanotechnology Spectroscopy Characterization (materials science)
Zdroj:	X-Ray Spectrometry. 19:73-77
ISSN:	1097-4539 0049-8246
Popis:	The production, properties and structure of II–VI semiconductor materials are topics of increasingly intense research activity. This paper discusses the use of the surface analytical techniques x-ray photoelectron spectroscopy, Auger electron spectroscopy and energy-dispersive x-ray spectroscopy to study and characterize these materials, and hence assist in understanding the growth process.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7fdffb13029ba7be630dae426fb4d66d https://doi.org/10.1002/xrs.1300190209 Zobrazit plný text záznamu Plný text