Characterization of Single-Event Transients in Schmitt Trigger Inverter Chains Operating at Subthreshold Voltages
| Autor: | Austin H. Roach, Peter Gadfort, Matthew J. Gadlage, Scott D. Stansberry, Jonathan R. Ahlbin |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Physics
Nuclear and High Energy Physics 010308 nuclear & particles physics business.industry Subthreshold conduction Electrical engineering 02 engineering and technology 01 natural sciences 020202 computer hardware & architecture Pulse (physics) Microsecond Nuclear Energy and Engineering Schmitt trigger 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Inverter Node (circuits) Electrical and Electronic Engineering business Electronic circuit Voltage |
| Zdroj: | IEEE Transactions on Nuclear Science. 64:637-642 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/tns.2016.2629448 |
| Popis: | Single-event transients (SETs) induced by alpha particles and heavy ions are measured and analyzed with subthreshold voltage SET characterization circuits. Using a Schmitt trigger inverter target chain fabricated in a 65-nm bulk CMOS process, SET pulse widths are captured from an operating voltage down to 0.32 V. At nominal voltages, the Schmitt trigger inverter chain is immune to SETs, but at subthreshold voltages energetic particles can induce SET pulse widths that range up to and over a microsecond. Additionally, the results show that at subthreshold voltages the 28-nm node offers a significant improvement in the SET response over the 65-nm node. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|