Crystal Growth and Temperature Evolution of the Atomic Structure of Pr3Ga5SiO14 from the Langasite Family

Autor:	Alexander P. Dudka, A. M. Balbashov
Rok vydání:	2020
Předmět:	010302 applied physics Diffraction Zone melting Range (particle radiation) Materials science Analytical chemistry Crystal growth General Chemistry 010403 inorganic & nuclear chemistry Condensed Matter Physics 01 natural sciences 0104 chemical sciences symbols.namesake Ultrahigh resolution 0103 physical sciences symbols General Materials Science Atomic displacement Debye
Zdroj:	Crystallography Reports. 65:223-227
ISSN:	1562-689X 1063-7745
DOI:	10.1134/s1063774520020054
Popis:	Pr3Ga5SiO14 crystals from the langasite family have been grown by the floating zone melting technique. Their X-ray diffraction analysis is performed at 16 different temperatures in range of 94–293 K. An experiment with ultrahigh resolution at 94 K has yielded the most exact structural model: sp. gr. P321, Z = 1, a = 8.07636(4) A, c = 5.06586(2) A, R1/wR2 = 1.192/1.185%, and Δρmin/Δρmax = –0.93/+0.79 e/A3 for 3852 unique reflections and 123 refined parameters. The temperature evolution of atomic displacement parameters is estimated based on multitemperature data using the extended Einstein and Debye models. Static components of atomic displacements are selected and the characteristic Einstein and Debye temperatures for structure atoms are determined. No structural anomalies have been found.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7fbe4b1efb4c6d682a0b17b69eda33aa https://doi.org/10.1134/s1063774520020054 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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