Damage Analysis of CCD Image Sensor Irradiated by Continuous Wave Laser

Autor:	Sunghee Yoon, Kyung-Young Jhang, Wan-Soon Shin
Rok vydání:	2016
Předmět:	Materials science business.industry Damage analysis 02 engineering and technology 01 natural sciences 010309 optics 020303 mechanical engineering & transports Optics 0203 mechanical engineering 0103 physical sciences Continuous wave Irradiation Image sensor business
Zdroj:	Journal of the Korea Institute of Military Science and Technology. 19:690-697
ISSN:	1598-9127
DOI:	10.9766/kimst.2016.19.6.690
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7f7052eb9e22be84cb9cc9d158f9d9ad https://doi.org/10.9766/kimst.2016.19.6.690 Zobrazit plný text záznamu