Fitting Generalized Gaussian Distributions for Process Capability Index

Autor:	Bratislav Tasić, J.J. Dohmen, Theo G. J. Beelen, E. Jan W. ter Maten
Rok vydání:	2018
Předmět:	Generalized inverse Gaussian distribution symbols.namesake Gaussian Statistics Process capability index symbols Gaussian function Applied mathematics Statistical model Probability density function Generalized normal distribution Gaussian random field Mathematics
Zdroj:	Scientific Computing in Electrical Engineering ISBN: 9783319755373
DOI:	10.1007/978-3-319-75538-0_16
Popis:	The design process of integrated circuits (IC) aims at a high yield as well as a good IC-performance. The distribution of measured output variables will not be standard Gaussian anymore. In fact, the corresponding probability density function has a more flat shape than in case of standard Gaussian. In order to optimize the yield one needs a statistical model for the observed distribution. One of the promising approaches is to use the so-called Generalized Gaussian distribution function and to estimate its defining parameters. We propose a numerical fast and reliable method for computing these parameters.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7f2d23cc9dd99aa1e2edb8172b2bf754 https://doi.org/10.1007/978-3-319-75538-0_16 Zobrazit plný text záznamu