Charged particles and x-ray emission studies on a dense plasma focus device
| Autor: | Chijin Xiao, R. A. Behbahani, S. R. Chung |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Nuclear and High Energy Physics Radiation Dense plasma focus Materials science Ion beam Astrophysics::High Energy Astrophysical Phenomena X-ray 02 engineering and technology Plasma Electron 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Charged particle Ion Physics::Plasma Physics Physics::Space Physics 0103 physical sciences General Materials Science Atomic physics 0210 nano-technology |
| Zdroj: | Radiation Effects and Defects in Solids. 175:1015-1020 |
| ISSN: | 1029-4953 1042-0150 |
| DOI: | 10.1080/10420150.2020.1845693 |
| Popis: | The emission of charged particles, electron and ion beams, and radiation, soft and hard x-rays, from the pinching plasma have been investigated in the UofS-I dense plasma focus (DPF) device. The Uo... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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