Yellow luminescence and related deep levels in unintentionally doped GaN films
Autor: | Leeor Kronik, Ilan Shalish, Yossi Rosenwaks, U. Tisch, Yoram Shapira, G. Segal, Joseph Salzman |
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Rok vydání: | 1999 |
Předmět: | |
Zdroj: | Physical Review B. 59:9748-9751 |
ISSN: | 1095-3795 0163-1829 |
Popis: | The deep level energy distribution associated with the well-known ‘‘yellow luminescence’’ in GaN is studied by means of two complementary deep level techniques: photoluminescence and surface photovoltage spectroscopy. The combined experimental results show that the yellow luminescence is due to capture of conduction band electrons, or electrons from shallow donors ~with a maximum depth on the order of the thermal energy! by a deep acceptor level with a broad energy distribution, centered at ;2.2 eV below the conduction band edge. In addition, the results show that the density of yellow luminescence related states possesses a significant surface component. @S0163-1829~99!16215-5# |
Databáze: | OpenAIRE |
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