Differences in Printed Contacts Lead to Susceptibility of Silicon Cells to Series Resistance Degradation

Autor:	E. Ashley Gaulding, John S. Mangum, Steve Johnston, Chun-Sheng Jiang, Helio Moutinho, Mason Reed, Jim Rand, Robert Flottemesch, Timothy Silverman, Michael Deceglie
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Condensed Matter Physics Electronic Optical and Magnetic Materials
Zdroj:	IEEE Journal of Photovoltaics. 12:690-695
ISSN:	2156-3403 2156-3381
DOI:	10.1109/jphotov.2022.3150727
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7e278222b8eaa15a2405c29a5eefd7f3 https://doi.org/10.1109/jphotov.2022.3150727 Zobrazit plný text záznamu