Optical, Structural, and Photocarrier Studies of Cu x (CdTe) y O z Thin Films

Autor:	R. Velázquez-Hernández, J. Carmona-Rodriguez, I. Rojas-Rodriguez, Sergio Jiménez-Sandoval, Mario E. Rodríguez-García
Rok vydání:	2011
Předmět:	Diffraction Materials science Argon business.industry chemistry.chemical_element Condensed Matter Physics Oxygen Cadmium telluride photovoltaics Characterization (materials science) chemistry Phase (matter) Optoelectronics Thin film business Spectroscopy
Zdroj:	International Journal of Thermophysics. 32:720-728
ISSN:	1572-9567 0195-928X
DOI:	10.1007/s10765-011-0917-y
Popis:	In this research quaternary alloy thin films made of Cu, CdTe, and O have been grown and characterized. The samples used in this investigation were grown simultaneously by reactive RF co-sputtering and by introducing oxygen and argon in the chamber during growth and changing the power in the Cu target from 10 W to 50 W. The carrier distribution as a function of the position was studied by using energy dispersive spectroscopy–scanning electronic microscopy (EDS–SEM), micro-Raman spectroscopy, and photocarrier images. Structural characterization was carried out by using X-ray diffraction. According to the results, a lateral carrier distribution was found in all samples and a new phase identified as Cu2Te was revealed for samples grown at 50 W.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7e16ece02aee7084571d7aaacf50e532 https://doi.org/10.1007/s10765-011-0917-y Zobrazit plný text záznamu Full text from SpringerLink