Optical microscope with SNOM option for micro- and nanoanalytical investigations at low temperatures
| Autor: | K. Pierz, C. Dal Savio, B. Güttler, H.-U. Danzebrink, D. V. Kazantsev |
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| Rok vydání: | 2003 |
| Předmět: |
Scanning Hall probe microscope
Materials science Spectrometer business.industry Near-field optics General Chemistry Substrate (electronics) Condensed Matter::Mesoscopic Systems and Quantum Hall Effect law.invention Optics Optical microscope Quantum dot law General Materials Science Near-field scanning optical microscope Spectroscopy business |
| Zdroj: | Applied Physics A: Materials Science & Processing. 76:889-892 |
| ISSN: | 1432-0630 0947-8396 |
| DOI: | 10.1007/s00339-002-1970-y |
| Popis: | A combined system for far- and near-field optical spectroscopy consisting of a compact scanning near-field optical microscope (SNOM) and a dedicated spectrometer was realised. This setup allows investigations at various temperatures from room to liquid-helium temperature. After a description of the apparatus, scanning force topography images of self-assembled InAs quantum dots on a GaAs substrate with a density of less than one dot per square micron are shown, followed by first spectroscopic investigations of such a sample. The presented results demonstrate the potential of the system. |
| Databáze: | OpenAIRE |
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