Nanofocused X-Ray Beam to Reprogram Secure Circuits
| Autor: | L. Maingault, Jean-luc Rainard, Jessy Clédière, Stéphanie Anceau, Rémi Tucoulou, Pierre Bleuet |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Materials science
010308 nuclear & particles physics business.industry Transistor 02 engineering and technology Integrated circuit 01 natural sciences 020202 computer hardware & architecture law.invention Microcontroller Flash (photography) law 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Optoelectronics State (computer science) business Beam (structure) EEPROM Electronic circuit |
| Zdroj: | Lecture Notes in Computer Science ISBN: 9783319667867 CHES |
| DOI: | 10.1007/978-3-319-66787-4_9 |
| Popis: | Synchrotron-based X-ray nanobeams are investigated as a tool to perturb microcontroller circuits. An intense hard X-ray focused beam of a few tens of nanometers is used to target the flash, EEPROM and RAM memory of a circuit. The obtained results show that it is possible to corrupt a single transistor in a semi-permanent state. A simple heat treatment can remove the induced effect, thus making the corruption reversible. An attack on a code stored in flash demonstrates unambiguously that this new technique can be a threat to the security of integrated circuits. |
| Databáze: | OpenAIRE |
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