Direct determination of trace elements in niobium, tantalum and their oxides by inductively coupled plasma atomic emission spectrometry after microwave dissolution
| Autor: | T. F. Kudinova, O. N. Grebneva, Irina V. Kubrakova, N.M. Kuz'min |
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| Rok vydání: | 1997 |
| Předmět: |
Detection limit
Analytical chemistry Niobium Tantalum chemistry.chemical_element Atomic and Molecular Physics and Optics Analytical Chemistry law.invention Matrix (chemical analysis) chemistry law Niobium oxide Inductively coupled plasma Atomic absorption spectroscopy Instrumentation Dissolution Spectroscopy |
| Zdroj: | Spectrochimica Acta Part B: Atomic Spectroscopy. 52:1151-1159 |
| ISSN: | 0584-8547 |
| DOI: | 10.1016/s0584-8547(97)00017-7 |
| Popis: | Analytical schemes for the determination of trace elements in high-purity niobium, tantalum and their oxides are proposed. The schemes are based on microwave dissolution of the metals and oxides followed by inductively coupled plasma atomic emission spectrometry (ICP-AES) determination of impurities in the solutions. The possibilities of interelement and off-peak background corrections in ICP-AES analysis are discussed. The accuracy of the results obtained is confirmed by the determination of trace elements after a matrix sorption separation procedure. For a number of elements, a comparison of the results obtained by ICP-AES without and with the matrix separation procedure and by electrothermal atomic absorption spectrometry (ETAAS) shows good agreement. The limits of detection for direct ICP-AES determination are in the range 0.4*1.0 μg g−1 for Ba, Ca, Fe, Mg, Mn, Y and La; between 2.0 and 10.0 μ g−1 for B, Cd, Co, Cr, Cu, Hf, Mo, Na, Nb, Ni, Pb, Sr, Ti, Zr and Ta; and for K, Sb and W a detection limit of 20 μ g−1 is achieved. The schemes proposed are intended for rapid routine analysis. |
| Databáze: | OpenAIRE |
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