Optoelectronic characterization of microcrystalline silicon films
| Autor: | Frank Wünsch, Marinus Kunst, G. Citarella, S von Aichberger |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Microwave frequency range
Materials science business.industry Photoconductivity Analytical chemistry Trapping Condensed Matter Physics Electronic Optical and Magnetic Materials Characterization (materials science) Microcrystalline silicon Materials Chemistry Ceramics and Composites Optoelectronics Charge carrier Absorption (electromagnetic radiation) business |
| Zdroj: | Journal of Non-Crystalline Solids. :756-760 |
| ISSN: | 0022-3093 |
| DOI: | 10.1016/s0022-3093(01)01111-5 |
| Popis: | The optoelectronic properties of μc-Si films produced in different ways are studied by contactless transient photoconductivity measurements in the microwave frequency range. A strong charge carrier trapping is observed in most μc-Si films. The effective mobility determined from these measurements appears to be an appropriate parameter to characterize these films. The films show a high absorption at 1064 nm, tentatively attributed mainly to defect absorption. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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