Millimeter wave on-wafer measurement of yeast cell suspension using a CPW test fixture in LCP technology

Autor:	Ilja Ocket, Song Liu, Bart Nauwelaers, Dominique Schreurs
Rok vydání:	2013
Předmět:	Permittivity Materials science business.industry Test fixture Extremely high frequency Electrical engineering Optoelectronics Wafer Dielectric Million Cells business Network analyzer (electrical) Billion Cells
Zdroj:	82nd ARFTG Microwave Measurement Conference.
DOI:	10.1109/arftg-2.2013.6737355
Popis:	This paper deals with the measurement of cell suspensions at millimeter wave frequencies between 30 GHz and 110 GHz using a CPW test fixture and an on-wafer network analyzer set-up. The measurement results show that yeast cell suspension with concentration as low as 4 million cells/ml or 4 cells/nl can be distinguished from water by their dielectric constants at millimeter wave frequencies. High contrast in the imaginary part of the permittivity is found for cell concentrations from 4 million cells/ml to 4 billion cells/ml.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7d44974c9e0407175364bb1f7f28d1d2 https://doi.org/10.1109/arftg-2.2013.6737355 Zobrazit plný text záznamu