Preliminary Outline of the IEEE PI 500 Scalable Architecture for Testing Embedded Cores

Autor:	C.J. Clark, Erik Jan Marinissen, D. Burek, L. Whetsel, R. Rajsuman, A. Sales, J. Monzel, J. Rajoki, M. Ricchatti, P. Varma, A. Zamfirescu, D. Stannard, Teresa McLaurin, S. Adham, J. Udell, Yervant Zorian, M. Collins, F. Muradali, G. Giles
Rok vydání:	2005
Předmět:	Test strategy Engineering Iterative design Computer architecture Acceptance testing business.industry Embedded system Time to market System testing Software performance testing Software reliability testing business Real-time testing
Zdroj:	Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).
DOI:	10.1109/vtest.1999.766707
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7d2a222aa5e483c8665cda638319594f https://doi.org/10.1109/vtest.1999.766707 Zobrazit plný text záznamu