Standby current prediction model for microprocessors reliability risk assessment
| Autor: | B. Lisenker |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Engineering
Standby current Current distribution business.industry Semiconductor device modeling Hardware_PERFORMANCEANDRELIABILITY Reliability engineering Reliability (semiconductor) Hardware_INTEGRATEDCIRCUITS Benchmark (computing) Risk assessment business Risk management Hardware_LOGICDESIGN Electronic circuit |
| Zdroj: | 2004 IEEE International Reliability Physics Symposium. Proceedings. |
| DOI: | 10.1109/relphy.2004.1315432 |
| Popis: | A model for ULSI circuit's standby current prediction is presented and discussed. The viability of the model is examined on 32-bit 0.13 /spl mu/m benchmark microprocessors actual data. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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