Simple Test and Modeling of RFID Tag Backscatter

Autor:	Jeffrey R. Guerrieri, David R. Novotny, Zoya Popovic, A. Ibrahim, Daniel G. Kuester
Rok vydání:	2012
Předmět:	Engineering Radiation Backscatter business.industry Condensed Matter Physics Transmitter power output Chip Narrowband Electronic engineering Figure of merit Radio-frequency identification Measurement uncertainty Electrical and Electronic Engineering business Sensitivity (electronics)
Zdroj:	IEEE Transactions on Microwave Theory and Techniques. 60:2248-2258
ISSN:	1557-9670 0018-9480
DOI:	10.1109/tmtt.2012.2195017
Popis:	We consider here worst-case analysis of backscatter from passive radio frequency identification (RFID) tags. The basis is a figure of merit “B” to relate link power at reader ports to tag circuit parameters. A minimum bound for received monostatic backscatter can be determined by inspection from measured B. The bound is general for narrowband signals in any causal linear propagation. For an assembled tag, this minimum varies only with reader transmit power, tag antenna tuning, and chip power sensitivity of different commands. To validate this model, we propose a backscatter calibration device to enable measurements with estimated 0.5 dB uncertainty. We then demonstrate how the minimum bound can inform reader sensitivity specification to help ensure reliable inventory performance.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7ca2768068dc7e77280933877016d329 https://doi.org/10.1109/tmtt.2012.2195017 Zobrazit plný text záznamu