Remote Optical Temperature Sensing Using a Flat-Parallel Dielectric Wafer

Autor:	Vachagan V. Harutyunyan, Aram Papoyan
Rok vydání:	2021
Předmět:	Materials science business.industry Measure (physics) Physics::Optics General Physics and Astronomy Dielectric Radiation Laser law.invention Optics Interference (communication) law Reflection (physics) Wafer business Refractive index
Zdroj:	Journal of Contemporary Physics (Armenian Academy of Sciences). 56:192-195
ISSN:	1934-9378 1068-3372
DOI:	10.3103/s106833722103004x
Popis:	It is demonstrated that reflection of a continuous-wave single-frequency laser radiation from a thick flat-parallel glass wafer can be used for precise remote measurement of temperature. Such measurement relies on the low-finesse Fabry-Perot nature of the dielectric wafer, whose optical thickness depends on temperature due to two characteristics of the dielectric material: the linear expansion coefficient and the thermo-optic coefficient. For the used glass wafer with a refractive index of 1.5183 and a thickness of 15.75 mm, the temperature distance between adjacent interference peaks was 1.4825°C, which made it possible to measure the temperature with a mean accuracy of 0.005°C. Performance aspects of the proposed temperature sensor and its practical applicability are analyzed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7c6542417a9f69ddc60a3c16d2a4c0ea https://doi.org/10.3103/s106833722103004x Zobrazit plný text záznamu Full text from SpringerLink