Total Ionizing Dose Response of a 22-nm Compiled Fully-Depleted-Silicon-on-Insulator Static Random Access Memory

Autor:	Lawrence T. Clark, William E. Brown, Keith E. Holbert, A. Rao, P. Bikkina, Marek Turowski, Andrew Levy, T. Olvarez, Jim D. Butler, Clifford YoungSciortino, Steven M. Guertin
Rok vydání:	2023
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. :1-1
ISSN:	1558-1578 0018-9499
DOI:	10.1109/tns.2023.3244106
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7c5f47193f7ac3ae3aa4a7a8cb290aef https://doi.org/10.1109/tns.2023.3244106 Zobrazit plný text záznamu