A New Rapid Detection of the Temperature Coefficient System
Autor: | Na Liu, Xue Yi Li, Xian Yan Chen, Qing Huo Liu, Fen Xiao |
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Rok vydání: | 2015 |
Předmět: | |
Zdroj: | Applied Mechanics and Materials. 742:212-215 |
ISSN: | 1662-7482 |
DOI: | 10.4028/www.scientific.net/amm.742.212 |
Popis: | The temperature coefficient of the microwave dielectric ceramic materials is one of the important dielectric property parameters. A new method, which can detect the temperature coefficient of microwave dielectric ceramic material, is presented in this article. The test method and software buildup of the system are also introduced. The new system has the advantage in obtaining fast, reliable and high accuracy measurement performance. |
Databáze: | OpenAIRE |
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