Insights and challenges toward understanding the electronic properties of hydrogenated nanocrystalline silicon

Autor:	Baojie Yan, Peter G. Hugger, J. David Cohen, Jeffrey Yang, Subhendu Guha
Rok vydání:	2009
Předmět:	Amorphous silicon Materials science Silicon business.industry Micromorph Nanocrystalline silicon chemistry.chemical_element Condensed Matter Physics Capacitance Amorphous solid chemistry.chemical_compound chemistry Photovoltaics Optoelectronics Thin film business
Zdroj:	Philosophical Magazine. 89:2541-2555
ISSN:	1478-6443 1478-6435
Popis:	Hydrogenated nanocrystalline silicon (nc-Si:H) is a complex mixed-phase material containing regions of silicon nanocrystallites interspersed with amorphous silicon. It is an important material in efforts to advance the production of more economical multijunction thin-film silicon-based photovoltaic technologies. We have applied the junction capacitance methods of transient photocapacitance spectroscopy and drive-level capacitance profiling to understand its fundamental electronic properties. We compare results in both the annealed and light-soaked states for nc-Si:H samples having a wide range of amorphous-to-crystallite volume fractions. Significant differences between samples with lower and higher amorphous fractions are observed and we propose a tentative microscopic model that may account for these differences.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7c3105ad3d5f3d2e80880ff3c42e23e4 https://doi.org/10.1080/14786430902886928 Zobrazit plný text záznamu